APPARATUS AND METHOD FOR CONTROLLING TEST TEMPERATURE OF ELECTRONIC COMPONENT PUSHING APPARATUS OF TEST CHAMBER AND TEST HANDLER FOR TESTING ELECTRONIC COMPONENT

摘要

The present invention relates to an electronic component device test temperature control apparatus and method, a pushing apparatus for a test chamber, and an electronic component test apparatus. According to one embodiment of the present invention, there is provided a test temperature controller for controlling a test element to a test temperature in an electronic component test chamber, comprising: a thermoelectric element module formed in each distal end of a pusher for pushing a test element to be tested; and a pattern board for transmitting power to each thermoelectric module connected through a connection cable, wherein each distal end of the pusher is made of a thermally conductive material. In addition, a pushing apparatus and an electronic component test apparatus in a test chamber including a method for controlling an electronic component test temperature and an electronic component test temperature adjusting apparatus are proposed.