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Non-destructive mode cache programming in NAND flash memory devices

机译:NAND闪存设备中的非破坏性模式缓存编程

摘要

A method of cache programming of a NAND flash memory in a triple-level-cell (TLC) mode is provided. The method includes discarding an upper page of a first programming data from a first set of data latches in a plurality of page buffers when a first group of logic states are programmed and verified. The plurality of page buffers include the first, second and third sets of data latches, configured to store the upper page, middle page and lower page of programming data, respectively. The method also includes uploading a lower page of second programming data to a set of cache latches, transferring the lower page of the second programming data from the set of cache latches to the third set of data latches after discarding the lower page of the first programming data, and uploading a middle page of the second programming data to the set of cache latches.
机译:提供了一种在三级小区(TLC)模式中的NAND闪存的高速缓存编程方法。 该方法包括在编程和验证第一组逻辑状态时从多个页面缓冲器中的第一组数据锁存中丢弃第一编程数据的上页。 多个页面缓冲器包括第一,第二和第三组数据锁存器,其被配置为分别存储上页,中间页面和下一页编程数据。 该方法还包括将第二编程数据的下页上载到一组高速缓存锁存器,在丢弃第一编程的下页之后将第二编程数据的下一页从一组高速缓存锁存传送到第三组数据锁存器 数据,并将第二个编程数据的中间页上载到缓存锁存器集。

著录项

  • 公开/公告号US11189326B1

    专利类型

  • 公开/公告日2021-11-30

    原文格式PDF

  • 申请/专利权人 YANGTZE MEMORY TECHNOLOGIES CO. LTD.;

    申请/专利号US202017062228

  • 发明设计人 JASON GUO;

    申请日2020-10-02

  • 分类号G11C8;G11C7/10;G11C7/14;

  • 国家 US

  • 入库时间 2022-08-24 22:15:24

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