首页> 外国专利> HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SYSTEM

HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SYSTEM

机译:外差扫描探针显微镜方法和系统

摘要

The present invention relates to a heterodyne scanning probe microscopy method for imaging structures on or below the surface of a sample, the method including applying, using a transducer, an acoustic input signal to the sample sensing, using a probe including a probe tip in contact with the surface, an acoustic output signal, wherein the acoustic output signal is representative of acoustic surface waves induced by the acoustic input signal wherein the acoustic input signal comprises at least a first signal component having a frequency above 1 gigahertz, and wherein for detecting of the acoustic output signal the method comprises a step of applying a further acoustic input signal to at least one of the probe or the sample for obtaining a mixed acoustic signal, the further acoustic input signal including at least a second signal component having a frequency above 1 gigahertz, wherein the mixed acoustic signal comprises a third signal component having a frequency equal to a difference between the first frequency and the second frequency, wherein the frequency of the third signal component is below 1 gigahertz.
机译:本发明涉及用于在样品表面上或下方的成像结构的外差扫描探针显微镜方法,该方法包括使用换能器向样本感测到样本感测的方法,包括探头在接触中利用表面,声输出信号,其中声输出信号代表由声学输入信号引起的声学表面波,其中声学输入信号包括具有高于1千兆赫兹的频率的第一信号分量,并且其中用于检测声输出信号该方法包括将其他声学输入信号施加到探针或样本中的至少一个以获得混合声学信号的步骤,其另一声学输入信号包括至少一个频率高于1的频率的声学输入信号吉格赫兹,其中混合声信号包括具有等于差异B的频率的第三信号分量第一频率和第二频率,其中第三信号分量的频率低于1千兆赫兹。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号