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Manufacturing process of aluminum gallium nitride (AlGaN) nanostructures

机译:氮化铝(AlGaN)纳米结构的制造过程

摘要

The invention relates to a method for manufacturing AlGaN nanostructures (BQ) comprising the following steps: at least one step of alternating epitaxial growth (AC), said step of alternating epitaxial growth being carried out at a defined epitaxial temperature and comprising: an epitaxial growth substep (CA1) of GaN; andan AlyGa1-yN epitaxial growth substep (CA2) performed after the GaN epitaxial growth substep, y being a number greater than 0 and less than or equal to 1; said at least one alternating epitaxial growth step leading to the formation of intermediate nanostructures (BQI) in a pseudo-alloy of AlzGa1-zN resulting from the combination of the epitaxial layers, z being a number less than y; - an annealing step at an annealing temperature greater than or equal to 820 ± 20 ° C or greater by at least 100 ° C compared to the epitaxy temperature and leading to the formation of nanostructures (BQ) in AlzGa1-zN. Figure for the abstract: figure 2
机译:本发明涉及制备AlGaN纳米结构(BQ)的方法,包括以下步骤:交替外延生长(AC)的至少一个步骤,所述步骤在限定的外延温度下进行外延生长并包含:外延生长 GaN的子步骤(CA1); Andan Alyga1-yn外延生长子表演(CA2)在GaN外延生长子步骤后进行,Y是大于0且小于或等于1的数字; 所述至少一种交替的外延生长步骤,其导致中间纳米结构(BQI)在由外延层的组合形成的Alzga1-Zn的伪合金中形成,Z为小于Y; - 与外延温度相比,退火温度的退火步骤大于或等于820±20℃或更大的820℃,并导致阿尔茨加1-Zn中的纳米结构(BQ)的形成。 摘要图:图2

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