首页> 外国专利> THREE-DIMENSIONAL MEMORY DEVICES WITH ENLARGED JOINT CRITICAL DIMENSION AND METHODS FOR FORMING THE SAME

THREE-DIMENSIONAL MEMORY DEVICES WITH ENLARGED JOINT CRITICAL DIMENSION AND METHODS FOR FORMING THE SAME

机译:具有扩大关节关键尺寸的三维存储器件和用于形成相同的方法

摘要

Embodiments of three-dimensional (3D) memory devices with an enlarged joint critical dimension and methods for forming the same are disclosed. In an example, a 3D memory device is disclosed. The 3D memory device includes a substrate, a memory stack having a plurality of interleaved conductor layers and dielectric layers on the substrate, and a memory string extending vertically through the first memory stack and having a memory film along a sidewall of the memory string. The memory film includes a discontinuous blocking layer interposed by the dielectric layers.
机译:公开了具有扩大关节关键尺寸的三维(3D)存储器件的实施例及其形成相同的方法。在示例中,公开了一种3D存储器设备。 3D存储器件包括基板,存储器堆叠,存储器堆叠具有多个交织导体层和基板上的介电层,以及通过第一存储器堆叠垂直延伸的存储器串,并沿着存储器串的侧壁具有存储膜。存储膜包括由介电层插入的不连续阻挡层。

著录项

  • 公开/公告号US2021225861A1

    专利类型

  • 公开/公告日2021-07-22

    原文格式PDF

  • 申请/专利权人 YANGTZE MEMORY TECHNOLOGIES CO. LTD.;

    申请/专利号US202016860890

  • 发明设计人 YONGGANG YANG;

    申请日2020-04-28

  • 分类号H01L27/11582;H01L27/11524;H01L27/11556;H01L29/423;H01L21/28;H01L27/1157;H01L21/311;H01L21/02;

  • 国家 US

  • 入库时间 2024-06-14 21:49:19

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