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GALLIUM OXIDE SCHOTTKY DIODE AND MANUFACTURING METHOD THEREFOR

机译:氧化镓肖特基二极管和制造方法

摘要

Provided are a gallium oxide Schottky diode and a manufacturing method therefor. The gallium oxide Schottky diode sequentially comprises, from bottom to top, a cathode metal layer (11), a high-doped gallium oxide substrate (12), a low-doped gallium oxide epitaxial layer (13), anode metal (151), and an anode field plate (152), wherein the upper part of the low-doped gallium oxide epitaxial layer (13) further comprises a plurality of dielectric layers (141, 142) distributed around the anode metal (151); the corrosion rate of each dielectric layer (141, 142) of the plurality of dielectric layers (141, 142) reduces as the number of the layer where the dielectric layer is located increases; and the top layer (142) of the plurality of dielectric layers (141, 142) is in contact with the anode metal (151), and the bottom layer (141) of the plurality of dielectric layers (141, 142) is separated from the anode metal (151). The influence of an interface state on the electric leakage of a device can be improved, a breakdown property of the device is improved, and better structural symmetry is provided.
机译:提供是氧化镓肖特基二极管和制造方法。氧化镓肖特基二极管顺序地包括,从底部到顶部,阴极金属层(11),高掺杂的氧化镓基板(12),低掺杂的氧化镓外延层(13),阳极金属(151),和阳极场板(152),其中低掺杂的氧化镓外延层(13)的上部还包括分布在阳极金属(151)周围的多个介电层(141,142);多个介电层(141,142)的每个介电层(141,142)的腐蚀速率随着介电层所在的层的数量而降低;多个介电层(141,142)的顶层(142)与阳极金属(151)接触,并且多个介电层(141,142)的底层(141)分离阳极金属(151)。可以提高界面状态对装置的电泄漏的影响,改善了装置的击穿特性,并且提供了更好的结构对称性。

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