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Wafer inspection system, wafer inspection apparatus and prober
Wafer inspection system, wafer inspection apparatus and prober
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机译:晶圆检测系统,晶圆检测设备和探针
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摘要
A wafer inspection system is provided. The wafer inspection system includes: a transfer region in which a transfer device is arranged; an inspection region in which test heads for inspecting a substrate are arranged; and a maintenance region in which the test heads are maintained. The inspection region is located between the transfer region and the maintenance region, a plurality of inspection rooms accommodating the test heads are adjacent to each other in the inspection region, and the test heads are configured to be unloaded from the inspection region to the maintenance region.
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