首页> 外国专利> DETERMINATION OF CRYSTAL SINGLES RATES TO ESTIMATE MEAN RANDOM COINCIDENCE RATE

DETERMINATION OF CRYSTAL SINGLES RATES TO ESTIMATE MEAN RANDOM COINCIDENCE RATE

机译:晶体单打率的测定估计平均随机巧合率

摘要

Systems and methods to determine random coincidence rates include determination of a detector rate for each of a plurality of detectors of a positron emission tomography scanner based on a frame of positron emission tomography data, determination of a sensitivity for each detector crystal of the plurality of detectors, based on the detector rate of the detector including the detector crystal, determination of a singles rate for each detector crystal based on the detector rate of the detector including the detector crystal and the determined sensitivity of the detector crystal, estimation of a mean random coincidence rate for each of a plurality of pairs of the detector crystals based on the singles rate of each detector crystal of each of the plurality of pairs of the detector crystals, correction of the acquired frame of positron emission tomography data based on the estimated mean random coincidence rates, and reconstruction of a positron emission tomography image based on the corrected frame of positron emission tomography data.
机译:用于确定随机巧合速率的系统和方法包括基于正电子发射断层扫描数据帧的正电子发射断层扫描仪的多个检测器中的每一个的检测率的确定,确定多个检测器的每个检测器晶体的灵敏度基于包括检测器晶体的检测器的检测器速率,基于包括检测器晶体的检测器的检测器速率和检测器晶体的确定灵敏度,确定每个检测器晶体的单打率,估计平均随机巧合的探测器基于多个检测器晶体中的每一个的每个探测器晶体的单个速率,基于估计的平均随机巧合的每个检测器晶体的每个检测器晶体的单个速率的每个检测器晶体的每个检测器晶体的单个速率校正基于Correc的正电子发射断层扫描图像的速率和重构泰德框架的正电子发射断层扫描数据。

著录项

  • 公开/公告号US2021124067A1

    专利类型

  • 公开/公告日2021-04-29

    原文格式PDF

  • 申请/专利权人 SIEMENS MEDICAL SOLUTIONS USA INC.;

    申请/专利号US201916661207

  • 发明设计人 MEHMET AYKAC;VLADIMIR Y. PANIN;

    申请日2019-10-23

  • 分类号G01T1/29;G01T1/202;G01T1/172;

  • 国家 US

  • 入库时间 2022-08-24 18:25:45

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