EFFICIENT FAULT ANALYSIS THROUGH SIMULATED FAULTS IN A DIGITAL TWIN

摘要

The present invention relates to a method and to a device for identifying causes of faults in automated systems, and to an automated system comprising the device for identifying causes of faults in automated systems. In a digital twin of the automated system, at least one element of the digital twin is assumed to be faulty and then simulated using the digital twin until a fault time. At least one faulty element of the automated system is identified as the cause of a fault based on the at least one element assumed to be faulty.