首页> 外国专利> A METHOD FOR FABRICATING AN ASYMMETRIC VERTICAL NANOWIRE MOSFET AND AN ASYMMETRIC VERTICAL NANOWIRE MOSFET

A METHOD FOR FABRICATING AN ASYMMETRIC VERTICAL NANOWIRE MOSFET AND AN ASYMMETRIC VERTICAL NANOWIRE MOSFET

机译:一种制造非对称垂直纳米线MOSFET的方法和不对称垂直纳米线MOSFET

摘要

There is provided a method for fabricating an asymmetric vertical nanowire MOSFET (100) on a semiconductor substrate (110) comprising at least one vertical nanowire (125), comprising a core portion (120) and a shell portion (130) circumscribing the core portion (120). The method comprises depositing a protection layer (140) on the semiconductor substrate (110), forming a top contact (150) around a remaining portion (120t) of the vertical nanowire (125) not covered by the protection layer (140), removing the protection layer (140), depositing a spacer layer (160) on the semiconductor substrate (110), removing a shell portion of the intermediate portion (125i) of the bottom portion (125b) of the vertical nanowire (125), trimming a shell portion of the upper portion (125u) of the bottom portion (125b) of the vertical nanowire (125), depositing a metal gate (170) on the spacer layer (160), and forming a lower and an upper source drain portions.
机译:提供了一种用于在半导体衬底(110)上制造不对称垂直纳米线MOSFET(100)的方法,该半导体衬底(110)包括至少一个垂直纳米线(125),所述垂直纳米线(125)包括芯部(120)和壳体部分(130),所述壳体部分(130)围绕芯部(120)。该方法包括在半导体衬底(110)上沉积保护层(140),在不被保护层(140)覆盖的垂直纳米线(125)的剩余部分(120t)周围形成顶部接触(150),覆盖保护层(140),在半导体衬底(110)上沉积间隔层(160),除去垂直纳米线(125)的底部(125b)的中间部分(125b)的壳部分,修剪a垂直纳米线(125)的底部(125b)的上部(125b)的壳部分,在间隔层(160)上沉积金属栅极(170),并形成下源极漏极部分和上源极漏部分。

著录项

  • 公开/公告号WO2021052878A1

    专利类型

  • 公开/公告日2021-03-25

    原文格式PDF

  • 申请/专利权人 C2AMPS AB;

    申请/专利号WO2020EP75437

  • 发明设计人 WERNERSSON LARS-ERIK;KILPI OLLI-PEKKA;

    申请日2020-09-11

  • 分类号H01L29/06;B82Y10;B82Y40;H01L27/088;H01L29/08;H01L29/205;H01L29/40;H01L29/41;H01L29/417;H01L29/775;H01L21/336;

  • 国家 EP

  • 入库时间 2022-08-24 17:56:59

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