首页> 外国专利> SEMICONDUCTOR DEVICES HAVING A LOW MINORITY CARRIER LIFETIME AND PROCESS FOR PRODUCING SAME

SEMICONDUCTOR DEVICES HAVING A LOW MINORITY CARRIER LIFETIME AND PROCESS FOR PRODUCING SAME

机译:半导体器件的使用寿命短,并且生产工艺相同

摘要

Silicon diodes and silicon controlled rectifiers are provided with reduced minority carrier lifetimes without a significant increase in forward voltage drop or reverse leakage current by means of a gadolinium dopant which is diffused into the semiconductor wafers after first being applied on one face thereof by means of a conventional sputtering process. Gadolinium is sputtered onto the base side of the rectifiers from a foil of the pure metal in a vacuum. The wafers are then placed in a furnace at a temperature above 820 DEG C where the diffusion process takes place.
机译:硅二极管和可控硅整流器具有缩短的少数载流子寿命,而不会通过by掺杂剂显着增加正向压降或反向漏电流,which掺杂剂是在第一次通过单晶硅表面涂覆到半导体晶片后扩散到半导体晶片中的。常规溅射工艺。 vacuum在真空中从纯金属箔溅射到整流器的基面上。然后将晶片放在温度高于820℃的熔炉中,在该炉中进行扩散过程。

著录项

  • 公开/公告号CA938383A

    专利类型

  • 公开/公告日1973-12-11

    原文格式PDF

  • 申请/专利权人 RMC CORP;

    申请/专利号CA19710128221

  • 发明设计人 DONALD F. STAHR;

    申请日0000-00-00

  • 分类号H01L29/167;H01L21/00;H01L29/00;

  • 国家 CA

  • 入库时间 2022-08-23 05:58:30

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