A method for the use of teilfunktionsfaehigen half conductor memory building blocks in a work memory module

摘要

The amount of scrap can be considerably lessened and the costs can be reduced if even partially functioning semiconductor memory cells can be utilized in a working store. This has been achieved by arranging the individual byte-orientated modules, depending on the distribution of the double or multiple defects in the memory cells, optionally and flexibly in sectors. This is done in such a way that the defect correction device detects no defects or simple defects which can be corrected. A reconfiguration register in the memory module is used to store the control code for the grouping of the individual modules.