Stressed-unstressed standard for X-ray stress analysis and method of making same

摘要

This invention relates to a method and apparatus for simultaneously determining the sample to detector distance (R.sub.o) and the angle between the surface normal and the incident X-ray beam (&bgr;) of a position sensitive X-ray detection device for use in stress analysis determinations on an unknown sample. More specifically, the apparatus comprises a stressable sheet, means capable of being detachably fastened to opposite ends of the sheet, spreader means interposed between the means fastened to opposite ends of the sheet operative upon actuation to spread said means apart and tension the sheet, and a strain-free film coating one surface of the sheet. The method comprises the steps of stretching a sheet of stressable material to a known tension, coating the sheet with a strain-free film, and thereafter determining both the sample to detector distance and the angle between the surface normal and the incident X-ray beam from said stressed-unstressed standard using the same set-up under which the stress measurements will be taken on the actual sample.