NEAR-INFRARED LIGHT EMITTING DIODES AND DETECTORS EMPLOYING CDSNP2:INP HETERODIODES
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机译:使用CDSNP2:INP异质二极管的近红外发光二极管和检测器
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1494348 Electroluminescence WESTERN ELECTRIC CO Inc 9 Dec 1974 [10 Dec 1973] 53088/74 Heading C4S [Also in Division H1] The N type zone of an indium phosphide PN junction diode capable of emitting infra-red radiation contains tin donor atoms partially compensated by cadmium acceptor atoms the doping being such as to shift the wavelength peak emission intensity to a value between 0À925 and 1À1 Á. In a preferred embodiment the N type zone is deposited by liquid phase epitaxy on a 100, 111 or 110 orientated face of a cadmium or zinc doped P type indium phosphide body having a hole concentration of not more than 5 Î 10SP17/SP holes/cm.SP3/SP. The deposition step is performed in a sealed capsule as described in Specification 1,450,433 but using a presaturated melt richer in indium phosphide. After flooding the body the melt is cooled, typically at from 4-15‹ C. per hour. The cadmium and tin doping lowers the band gap of the P type region to give high quantum efficiency production of radiation having a wavelength up to 1À1 Á, which matches the low loss window of a fused silica glass optic fibre. Forward resistance of the diode may be lowered by substituting for the P type body a thin layer on a low resistivity substrate of indium phosphide.
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机译:1494348电致发光WESTERN ELECTRIC CO Inc 1974年12月9日[1973年12月10日] 53088/74标题C4S [也在H1分区中]能够发射红外辐射的磷化铟PN结二极管的N型区包含部分锡补偿的施主原子镉受体原子的掺杂使得波长峰值发射强度移至0‑925和1‑1Á之间的值。在一个优选的实施方案中,N型区通过液相外延沉积在空穴浓度不大于5≤10 17 <的镉或锌掺杂的P型磷化铟主体的100、111或110取向的面上。 / SP>孔/厘米。 3 SP>。如说明书1,450,433中所述,在密封的胶囊中进行沉积步骤,但是使用富含磷酸铟的预饱和熔体。注入主体后,将熔体冷却,通常为每小时4-15°C。镉和锡的掺杂降低了P型区的带隙,从而产生了高量子效率的辐射,其辐射波长高达1-1A,与熔融石英玻璃光纤的低损耗窗口匹配。通过将低电阻率的磷化铟衬底上的薄层替换为P型体,可以降低二极管的正向电阻。
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