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High frequency FET - has narrow channel between source and drain electrodes for high velocity electron injection

机译:高频FET-在源电极和漏电极之间具有狭窄的沟道,用于高速电子注入

摘要

The high frequency field effect transistor with a gate electrode forming a rectifier contact, has source and drain electrodes forming a channel on the semiconductor layer. Its length is less than 1 micron. The source electrode consists of a rectifying metal and semiconductor contact material which receives a potential so that it is tunnelled by charge carriers so that hot electrons are injected into the channel from the source electrode with a high initial velocity. The potential is selected so that the charge carriers have the maximum possible drift velocity. The channel length can be less than 0.4 micron. The drain electrode is of a non-rectifying ohmic metal contact in the semiconductor layer.
机译:具有栅电极形成整流器触点的高频场效应晶体管具有在半导体层上形成沟道的源电极和漏电极。其长度小于1微米。源电极由接收电势的整流金属和半导体接触材料组成,以使其被电荷载流子隧穿,从而以高的初始速度将热电子从源电极注入到沟道中。选择电势以使电荷载流子具有最大可能的漂移速度。通道长度可以小于0.4微米。漏极在半导体层中具有非整流性欧姆金属接触。

著录项

  • 公开/公告号DE2917407A1

    专利类型

  • 公开/公告日1980-11-06

    原文格式PDF

  • 申请/专利权人 LICENTIA PATENT-VERWALTUNGS-GMBH;

    申请/专利号DE19792917407

  • 发明设计人 BENEKINGHEINZPROF.DR.RER.NAT.;

    申请日1979-04-28

  • 分类号H01L29/80;

  • 国家 DE

  • 入库时间 2022-08-22 17:31:57

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