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DEFECT DETECTION METHOD FOR SUBSTANCE HAVING UNEVEN THICKNESS

机译:厚度不均的物质缺陷检测方法

摘要

PURPOSE:To improve the detection sensitivity and to simplify the detection method by using the correction members of specified structure. CONSTITUTION:A pair of correction members 7 are prepared. They consist of circular arc 7a equal to the outer circumference of CV cable 1, the material to be tested, and straight line part 7b. They posses a certain thickness in case perfectly fitted to CV cable 1, namely, the transmit routing length (2x) and are made of same material as the insulating layer of CV cable 1 or the material having the same line absorption coefficient for magnetic waves. And a pair of correction members 7 are arranged against the X-ray transmit route holding CV cable 1 between them off or in contact with, so as to make the straight line part 7b be perpendicular to the projecting X-ray. Thereby, when X-ray integrating sphere 4 and photomultiplier counter 6 are moved relatively against CV cable 1 and the defect detection is performed with the strength variation of transmit X-ray 5', then, the apparent transmit routing length can be easily made equal, thus, the expected purpose is attained.
机译:目的:通过使用指定结构的校正构件来提高检测灵敏度并简化检测方法。组成:准备一对矫正构件7。它们由等于CV电缆1的外圆周的圆弧7a,待测材料和直线部分7b组成。在完全适合CV电缆1的情况下,它们具有一定的厚度,即发送路由长度(2x),并且由与CV电缆1的绝缘层相同的材料或具有相同的电磁波线吸收系数的材料制成。并且,一对校正构件7相对于保持其间的CV电缆1的X射线透过路径配置成相互离开或接触,以使直线部7b垂直于投射的X射线。从而,当X射线积分球4和光电倍增器计数器6相对于CV电缆1相对移动并且利用透射X射线5′的强度变化来进行缺陷检测时,可以容易地使视在透射路径长度相等。因此,达到了预期的目的。

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