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Bandgap voltage reference employing sub - surface current using a standard cmos process

机译:带隙基准电压源采用标准cmos工艺采用次表面电流

摘要

A bandgap voltage reference employing only subsurface currents wich may be fabricated using a standard CMOS process. The reference includes first and second vertical bipolar transistors having common collectors formed in an integrated circuit substrate. A first resistor connects the emitter of the first transistor to ground potential. A second resistor connects the emitter of the second transistor to a reference node while a third resistor connects the reference node to ground. A differential amplifier has a positive input connected to the reference node, a negative input connected to the first transistor emitter and an output connected to the bases of the first and second transistors and also providing the reference voltage output. In a preferred form the output of the differential amplifier is buffered by a third transistor and coupled by a resistive divider to the first and second transistor bases so that the reference voltage may be selected at any scalar of the basic bandgap voltage.
机译:可以使用标准CMOS工艺来制造仅采用地下电流的带隙电压基准。参考包括具有在集成电路衬底中形成的公共集电极的第一和第二垂直双极晶体管。第一电阻器将第一晶体管的发射极连接到地电位。第二电阻器将第二晶体管的发射极连接至参考节点,而第三电阻器将参考节点接地。差分放大器具有连接到基准节点的正输入,连接到第一晶体管发射极的负输入和连接到第一和第二晶体管的基极并提供基准电压输出的输出。在优选形式中,差分放大器的输出由第三晶体管缓冲,并通过电阻分压器耦合至第一和第二晶体管基极,从而可以在基本带隙电压的任何标量下选择参考电压。

著录项

  • 公开/公告号DE3050217A1

    专利类型

  • 公开/公告日1982-03-18

    原文格式PDF

  • 申请/专利权人 MOSTEK CORP US;

    申请/专利号DE19803050217T

  • 发明设计人 OHRI K;HILDEBRAND D;CARUSO M;

    申请日1980-05-22

  • 分类号G05F1/58;H03L5/00;

  • 国家 DE

  • 入库时间 2022-08-22 12:40:23

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