CIRCUIT ARRANGEMENT FOR THE ELIMINATION OF FOREIGN ENVIRONMENTAL IMPACT ON SEMICONDUCTOR PICTURE DEVICES

摘要

The invention relates to a circuit arrangement for eliminating the effects of external light in semiconductor imaging devices of the second generation. It is used in measuring, handling and robot technology and here particularly in electro-optical measuring systems which require an exclusion of the effects of external light. The aim of the invention is the creation of an electro-optical measuring device comprising a laser as transmitter and a photo-sensitive high-resolution semiconductor imaging device as receiver, which, with little complexity, provides for reliable signal detection with strong effects of external light. The object is to be achieved to find possibilities for processing the opto-electronic received signal. This is done by a novel circuit arrangement being used for driving the semiconductor imaging device of the second generation. Using this circuit arrangement, an unknown effect previously not provided within the semiconductor imaging device can be utilised. The external light is suppressed without additional complexity, has high reliability and is characterised by low energy consumption. IMAGE