A digital circuit tester for performing signature analysis is provided with a memory (32) for storing successive samples at 256-bit intervals of the progressively evolving CRC signature of a signal in the circuit under test. Comparison with the same sequence from a known good unit facilitates identification of faults, even in feedback loops. To identify the first failing bit, the test is repeated, but with the CRC feedback connections disabled, and successive blocks of the actual data stream are stored, beginning at the point corresponding to the first faulty signature sample, for subsequent inspection and comparison with the data stream from the known good unit.
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