首页> 外国专利> Signal testing apparatus for large circuits - has cell chain operating in normal mode to supply analog- digital signal to digital circuit and digital-analog signal to analog circuit and in test mode analog circuit is decoupled from digital circuit

Signal testing apparatus for large circuits - has cell chain operating in normal mode to supply analog- digital signal to digital circuit and digital-analog signal to analog circuit and in test mode analog circuit is decoupled from digital circuit

机译:大型电路的信号测试设备-具有在正常模式下工作的单元链,以将模拟数字信号提供给数字电路,将数字模拟信号提供给模拟电路;在测试模式下,模拟电路与数字电路分离

摘要

The apparatus has a mixed signal circuit containing an analog circuit (4) to detect analog-to-digital signals and a digital circuit (10) to detect digital-to-analog signals. A boundary scan cell chain (50) connected between the two circuits receives the control signals. The cell chain operates in normal mode or in test mode depending on the control signals. Each analog-to-digital and digital-to-analog signals detected by the analog and digital circuits respectively are detected by the cell chain. In the normal operating mode, the analog-to-digital signal is supplied to the digital circuit and the digital-to- analog signal is supplied to the analog circuit. In the test mode, the analog circuit is decoupled from the digital circuit.
机译:该设备具有混合信号电路,该混合信号电路包括用于检测模数信号的模拟电路(4)和用于检测数模信号的数字电路(10)。连接在两个电路之间的边界扫描单元链(50)接收控制信号。单元链根据控制信号以正常模式或测试模式运行。分别由模拟电路和数字电路检测到的每个模数和数模信号都由单元链检测。在正常操作模式下,将模数信号提供给数字电路,并将数模信号提供给模拟电路。在测试模式下,模拟电路与数字电路解耦。

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