首页> 外国专利> electric circuit and structure for pressure and temperature probes with devices suitable for the correction of error of temperature on pressure signal and to eliminate the influence ofin the electrical resistance of conductors of the cable

electric circuit and structure for pressure and temperature probes with devices suitable for the correction of error of temperature on pressure signal and to eliminate the influence ofin the electrical resistance of conductors of the cable

机译:压力和温度探头的电路和结构,其装置适用于校正压力信号上的温度误差并消除电缆导体电阻的影响

摘要

An improved pressure/temperature probe whose accuracy will not be affected by the pressures and temperatures to which it is subject or by the resistance of the connecting cables. The probe includes a separate pressure transducer and temperature transducer which are connected in series to a constant current source. In addition to the pressure reading taken by the pressure probe, a temperature reading of the pressure probe is derived from the pressure probe. This temperature reading provides the actual temperature of the pressure probe and permits highly accurate temperature correction. The pressure probe is constructed and arranged so as to have a high thermal time constant while the temperature probe is constructed and arranged to have a low thermal time constant.
机译:一种改进的压力/温度探头,其精度不受其所承受的压力和温度或连接电缆电阻的影响。该探头包括一个单独的压力传感器和温度传感器,它们串联连接到恒定电流源。除了压力探头获取的压力读数外,压力探头的温度读数还来自压力探头。该温度读数提供了压力探头的实际温度,并允许高精度的温度校正。压力探头被构造和布置成具有高的热时间常数,而温度探头被构造和布置成具有低的热时间常数。

著录项

  • 公开/公告号IT1121122B

    专利类型

  • 公开/公告日1986-03-26

    原文格式PDF

  • 申请/专利权人 CISE S.P.A.;

    申请/专利号IT19790009309

  • 发明设计人 ADORNO NAPOLEONE;

    申请日1979-01-08

  • 分类号G01K;

  • 国家 IT

  • 入库时间 2022-08-22 07:39:17

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