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Nondestructive method for analyzing total porosity of thin sections

机译:薄壁总孔隙率的无损分析方法

摘要

Total porosity of impregnated thin sections can be measured using X- ray fluorescence. The technique requires an impregnating fluid which contains an element not contained in more than trace quantities by the rock. By measuring the intensity of fluorescence generated by bombarding the impregnated thin section with sufficiently energetic X- rays and rationing that intensity to the intensity of fluorescence generated by subjecting a sample containing only epoxy to the same conditions, and scaling the resulting measures of fluorescence, a measure of total effective porosity is produced.
机译:可以使用X射线荧光测量浸渍薄片的总孔隙率。该技术需要一种浸渍流体,该流体包含一种岩石中所含的微量元素。通过测量用足够高能的X射线轰击浸渍过的薄片所产生的荧光强度,并将该强度与仅含环氧的样品置于相同条件下所产生的荧光强度进行配比,然后按比例缩放所产生的荧光,产生总有效孔隙度的量度。

著录项

  • 公开/公告号US4797906A

    专利类型

  • 公开/公告日1989-01-10

    原文格式PDF

  • 申请/专利权人 AMOCO CORPORATION;

    申请/专利号US19870101880

  • 发明设计人 MICHAEL P. SMITH;

    申请日1987-09-28

  • 分类号G01N23/223;

  • 国家 US

  • 入库时间 2022-08-22 06:28:41

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