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MOLECULAR BEAM EPITAXIAL DEVICE AND MOLECULAR BEAM EPITAXIAL METHOD AND MOLECULAR BEAM CELL

机译:分子束外延器件和分子束外延方法及分子束单元

摘要

PURPOSE:To easily and automatically obtain a desired molecular beam intensity by inputting the output of a vacuum gage which measures the vacuum degree near a substrate and the outputs of temp. measuring means which measure the temp. of molecular beam cells to a control device and controlling the operations of heating means and shutters for the cell by the control device. CONSTITUTION:A substrate holder 4 and the vacuum gage 3 for measuring the molecular beam intensity are provided to face each other in a vacuum chamber 2 and further, the molecular beam cells 6, 8, 10, etc., are disposed. The shutters 7, 9, 11 are provided to the respective cells. The vacuum degree near the substrate is measured by the vacuum gage 3. The measured value thereof and the measured values obtd. by measuring the temps. of the molecular beam cells 6, 8, 10 are inputted to the control device 12. The values are compared with the previously inputted set values by the control device 12 and the heating means of the molecular beam cells 6, 8, 10 and the opening/closing operations of the shutters 7, 9, 11 are controlled in such a manner that said values coincide with the set values. The desired molecular beam intensity and molecular beam intensity ratio are thereby obtd.
机译:目的:通过输入测量衬底附近真空度的真空计的输出和温度的输出,轻松,自动地获得所需的分子束强度。测量温度的测量装置。将分子束单元控制到控制装置,并通过控制装置控制单元的加热装置和百叶窗的操作。组成:基板支架4和用于测量分子束强度的真空计3在真空室2中彼此面对,并进一步设置了分子束单元6、8、10等。快门7、9、11被提供给各个单元。通过真空计3测量基板附近的真空度。其测量值和测量值obtd。通过测量温度。分子束单元6、8、10中的一个被输入到控制装置12。通过控制装置12以及分子束单元6、8、10的加热装置和开口将这些值与先前输入的设定值进行比较。百叶窗7、9、11的/关闭操作以这样的方式控制,即,所述值与设定值一致。从而获得所需的分子束强度和分子束强度比。

著录项

  • 公开/公告号JPH01320290A

    专利类型

  • 公开/公告日1989-12-26

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19880153425

  • 发明设计人 BUSSHU TERUO;OBE ISAO;ISHINO MASAKAZU;

    申请日1988-06-23

  • 分类号C30B23/08;H01L21/203;

  • 国家 JP

  • 入库时间 2022-08-22 06:22:27

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