首页> 外国专利> MANUFACTURE OF PRESSURE RECEIVING DIAPHRAGM IN SEMICONDUCTOR PRESSURE SENSOR

MANUFACTURE OF PRESSURE RECEIVING DIAPHRAGM IN SEMICONDUCTOR PRESSURE SENSOR

机译:半导体压力传感器中承压膜片的制造

摘要

PURPOSE:To improve yield by forming the pattern of a pressure receiving diaphragm by photolithography, and etching an SiN film, and performing electrochemical etching, and then etching the SiO2 film at the end face of a boss part with the SiN film at the end face of a foot as a mask. CONSTITUTION:Al or Au is vapor deposited on the entire surfaces of the wirings from a diffusion resistance 13 and a diffusion terminal 14 so as to form electrodes 17 and 18. The electrode 18 is connected to the + pole of a constant currents source in an electrochemical etching vessel so as to form an anisotropic etching groove 21 in a substrate by electrochemical etching. Accordingly, at the substrate 10 are formed a boss part 19 (having an SiO2 film 12 at the end face) and a foot 20 (having an SiO2 film 12 and an SiN film 15 at the end face), By 10% HF solution or buffered hydrofluoric acid solution, the SiO2 film 12 at the end face of the boss part 19 is removed, with the SiN film 15 at the end face of the foot 20 as a mask, by etching. With KOH solution as etchant, electrochemical etching is done so as to form the boss part 19 into the specified form (specified, gap l is made to the end face of the foot 20).
机译:用途:通过光刻形成压力接收膜片的图案,蚀刻SiN膜,然后进行电化学蚀刻,然后在端面的SiN膜上蚀刻凸台部分端面的SiO2膜,以提高产量脚作为面具。组成:Al或Au从扩散电阻13和扩散端子14气相沉积在布线的整个表面上,从而形成电极17和18。电极18连接到恒流源的+极,电化学蚀刻容器,以通过电化学蚀刻在基板上形成各向异性蚀刻槽21。相应地,在基板10上,通过10%HF溶液或在其上形成凸台部分19(在端面上具有SiO 2膜12)和底脚20(在端面上具有SiO 2膜12和SiN膜15)。通过蚀刻在缓冲的氢氟酸溶液中,以在脚20的端面上的SiN膜15作为掩模,去除凸台部分19的端面上的SiO 2膜12。使用KOH溶液作为蚀刻剂,进行电化学蚀刻,以将凸台部19形成为规定的形状(规定的,在脚20的端面上形成间隙l)。

著录项

  • 公开/公告号JPH03131068A

    专利类型

  • 公开/公告日1991-06-04

    原文格式PDF

  • 申请/专利权人 FUJIKURA LTD;

    申请/专利号JP19890268154

  • 发明设计人 NISHIMURA HITOSHI;

    申请日1989-10-17

  • 分类号G01L9/04;G01L9/00;H01L29/84;

  • 国家 JP

  • 入库时间 2022-08-22 06:04:01

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