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PROCEDURE FOR FABRICATING DEVICES INVOLVING DRY ETCHING

机译:涉及干蚀刻的设备制造程序

摘要

- 18 -PROCEDURE FOR FABRICATING DEVICESINVOLVING DRY ETCHINGAbstractThe present invention relates to a process forfabricating a device comprising the steps of forming a resistmask on a substrate, etching the substrate to form a pluralityof etch pits defining a plurality of features by inducingreaction of the substrate with energetic species andcompleting the device. The redeposition of material on theside walls of the etch pit ocours during the etching. Theprocess includes at least one step chosen from the group ofsteps consisting of, 1) locally compensating for the effect ofthe redeposition on the conformation of the sidewall,2) when the redeposition material presents a barrier toisotropic etching in the sukstrate, contacting the etchingspecies with the resist mask so that the angle formed betweena) a tangent to the resist mask at the point the resist maskintercepts the substrate and (b) a perpendicular to thesubstrate at the point is less than arctan (X/Y), where X isthe horizontal rate of the redeposition at the point and Y isthe etchant rate of the substrate, and (3) limiting, when theredeposited material presents a barrier to isotropic etchingin the subatrate, the contact angle between the momentumdirection of the etchant species and a tangent to theredeposition material at all points on the resistantredeposition material serving to mask the sidewalls so thatthe contact angle is less than arctan (X/Z), where X is asdefined in step 2), where Z is the etchant rate of theredeposited material in a direction parallel to the etchantspecies momentum direction.
机译:-18-制造设备的程序参与干蚀刻抽象本发明涉及一种用于制造包括形成抗蚀剂的步骤的器件在基板上蚀刻掩模,以形成多个通过诱导定义多个特征的蚀刻坑的数量底物与高能物种的反应完成设备。重新沉积材料在蚀刻期间,蚀刻坑的侧壁会充满。的过程包括至少一个选自以下步骤的步骤:步骤包括:1)局部补偿以下影响:侧壁构型上的再沉积,2)当再沉积材料对基板中的各向同性蚀刻,与蚀刻接触物种与抗蚀剂掩模,使之间形成的角度a)在抗蚀剂掩模的点处与抗蚀剂掩模的切线拦截基材,并且(b)垂直于该点的底物小于反正切(X / Y),其中X为在点和Y处再沉积的水平速率为基板的蚀刻速率,以及(3)限制,再沉积的材料为各向同性蚀刻提供了障碍在子光栅中,动量之间的接触角蚀刻剂种类的方向以及与之的切线在电阻上的所有位置重新沉积材料重新沉积材料以掩盖侧壁,以便接触角小于arctan(X / Z),其中X为在步骤2)中定义,其中Z是在与蚀刻剂平行的方向上再沉积材料物种动量方向。

著录项

  • 公开/公告号CA1287556C

    专利类型

  • 公开/公告日1991-08-13

    原文格式PDF

  • 申请/专利权人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY;

    申请/专利号CA19860512190

  • 发明设计人 SCHUTZ RONALD JOSEPH;

    申请日1986-06-23

  • 分类号H01L21/306;C30B33/08;H01L21/308;

  • 国家 CA

  • 入库时间 2022-08-22 05:55:59

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