首页> 外国专利> Method of and apparatus for optically checking the appearances of chip- type components and sorting the chip-type components

Method of and apparatus for optically checking the appearances of chip- type components and sorting the chip-type components

机译:用于光学检查芯片型组件的外观并对芯片型组件进行分类的方法和装置

摘要

A method of optically checking the appearances of chips and sorting the chips comprises the steps of feeding chips onto chip-passage body to cause the chips to run on the chip-passage body in a predetermined direction; during the running of the chips on the chip- passage body, individually separating the chips to stop the chips one by one at each of two predetermined checking positions; irradiating light obliquely and straightly with respect to a chip at one of the predetermined checking positions to pick up an optical image of one of undersurface and top surface sides of the chip as a video signal by means of a first TV camera; irradiating light obliquely and straightly with respect to the chip at the other of the predetermined checking positions to pick up an optical image of the other of the undersurface and top surface sides of the chip as a video signal by means of a second TV camera; sending the video signals to image processing sections, each of which includes at least an analog-to-digital conversion unit, a video memory and a central processing unit, to process the video signals in the image processing sections and obtain data on the appearance of the chip and a tilt angle of the chip on each of the predetermined checking positions of the chip- passage body, thereby checking on the basis of the data whether the chip is acceptable or defective in its appearance; and thereafter sorting chips on the basis of the check results. Also, an apparatus for optically checking the appearances of chips and sorting the chips is disclosed.
机译:一种光学检查切屑外观并分类切屑的方法,包括以下步骤:将切屑进给到切屑通道主体上,以使切屑沿预定方向在切屑通道主体上运行。在切屑通道主体上运行切屑的过程中,分别分离切屑以使切屑在两个预定检查位置的每一个处逐一停止。在预定的检查位置之一上相对于芯片倾斜和笔直地照射光,以通过第一电视摄像机拾取芯片的底面和顶面之一的光学图像作为视频信号;在预定的检查位置中的另一个上相对于芯片倾斜且笔直地照射光,以通过第二电视摄像机获取芯片的下表面和上表面中的另一个的光学图像作为视频信号;将视频信号发送到图像处理部分,每个图像处理部分至少包括至少一个模数转换单元,视频存储器和中央处理单元,以处理图像处理部分中的视频信号并获得有关图像外观的数据在所述切屑通道主体的每个预定检查位置上切屑和所述切屑的倾斜角,从而基于所述数据检查所述切屑在外观上是可接受的还是有缺陷的;然后根据检查结果对筹码进行分类。另外,公开了一种用于光学检查芯片外观并对芯片进行分类的设备。

著录项

  • 公开/公告号US4976356A

    专利类型

  • 公开/公告日1990-12-11

    原文格式PDF

  • 申请/专利权人 TDK CORPORATION;

    申请/专利号US19890316791

  • 发明设计人 TOURU MIZUNO;YASUHIKO KITAJIMA;

    申请日1989-02-28

  • 分类号B07C5/02;B07C5/342;

  • 国家 US

  • 入库时间 2022-08-22 05:47:13

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