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X-RAY DIFFRACTION GONIOMETER AND X-RAY DIFFRACTION METHOD

机译:X射线衍射测角仪和X射线衍射法

摘要

PURPOSE:To enable a special highly accurate measurement in addition to normal diffraction measurement by use of theta - 2theta scanning, by enabling rough rotation and fine rotation of a sample bed and rough rotation and fine rotation of an X-ray detector. CONSTITUTION:A secondary rotary shaft 11 is held to a base 1 by a bearing 10. A first fine rotation drive mechanism 31 which will be explained hereinbelow is provided at the forward end of a sufficiently long first arm 15 which is fixed to the second rotary shaft 11, perpendicular the axis thereof. That is, the first arm 15 may be finely rotated, relative to the base 1, and accordingly, the second rotary shaft 11 may be finely rotated, relative to the base 1. A fourth rotary shaft 2 is held to the base 1 by a bearing 2. A second fine rotation drive mechanism 32 is provided at the forward end of a sufficiently long second arm 30 which is fixed to the fourth rotary shaft 3, perpendicular to the axis thereof. That is, the second arm 30 may be rotated finely, relative to the base 1, and accordingly, the fourth rotary shaft 3 may be also finely rotated, relative to the base 1.
机译:目的:通过使用theta-2theta扫描,除了可以进行正常的衍射测量外,还可以进行特殊的高精度测量,方法是使样品床能够粗略旋转和精细旋转,而X射线检测器能够粗略旋转。组成:次级旋转轴11通过轴承10固定在基座1上。下面将要说明的第一精细旋转驱动机构31设置在足够长的第一臂15的前端,该臂固定在第二旋转轴上轴11垂直于其轴线。即,第一臂15可以相对于基座1精细旋转,并且相应地,第二旋转轴11可以相对于基座1精细旋转。第四旋转轴2通过弹簧保持在基座1上。第二精细旋转驱动机构32设置在足够长的第二臂30的前端,该第二臂30垂直于第四旋转轴3的轴线固定至第四旋转轴3。即,第二臂30可以相对于基座1精细地旋转,因此,第四旋转轴3也可以相对于基座1精细地旋转。

著录项

  • 公开/公告号JPH04175645A

    专利类型

  • 公开/公告日1992-06-23

    原文格式PDF

  • 申请/专利权人 RIGAKU CORP;

    申请/专利号JP19900301029

  • 发明设计人 KIKUCHI TETSUO;

    申请日1990-11-08

  • 分类号G01N23/207;

  • 国家 JP

  • 入库时间 2022-08-22 05:43:49

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