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Single polysilicon cross-coupled resistor, six-transistor SRAM cell design technique

机译:单多晶硅交叉耦合电阻,六晶体管SRAM单元设计技术

摘要

A six-transistor latch cell is formed with resistors connecting opposite nodes of the latch. A Salicide (self-aligned silicide) isolation mask layer (25) is used to permit the use of a single layer of polysilicon (23) to implant both the two resistors and the six transistors. The Salicide isolation mask (25) is provided to mask all high energy dopant implants in the poly resistor region and to function as a dielectric between the poly resistor and the local interconnect (27) passing above it. This Salicide isolation layer (25) is easy to manufacture, and adds very little to the vertical topology.
机译:六晶体管锁存单元由电阻组成,该电阻连接锁存器的相对节点。自对准硅化物(自对准硅化物)隔离掩模层(25)用于允许使用单层多晶硅(23)来注入两个电阻器和六个晶体管。提供自对准硅化物隔离掩模(25)以掩蔽多晶硅电阻器区域中的所有高能掺杂剂注入,并用作多晶硅电阻器与经过其上方的局部互连(27)之间的电介质。该自对准硅化物隔离层(25)易于制造,并且几乎不增加垂直拓扑。

著录项

  • 公开/公告号US5126279A

    专利类型

  • 公开/公告日1992-06-30

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US19900559540

  • 发明设计人 GREGORY N. ROBERTS;

    申请日1990-07-23

  • 分类号H01L21/70;

  • 国家 US

  • 入库时间 2022-08-22 05:22:39

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