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Method of making polysilicon-via structure for four transistor, triple polysilicon layer SRAM cell including two polysilicon layer load resistor

机译:用于包括两个多晶硅层负载电阻器的四个晶体管,三层多晶硅层SRAM单元的多晶硅通孔结构的制造方法

摘要

This is a method of forming an SRAM transistor cell on a well in a doped semiconductor substrate. Form a gate oxide layer and a split gate layer with buried contact regions in the well and openings through the split gate layer and the gate oxide layer to the well. Form an intermediate conductor layer and a hard silicon oxide mask layer and define gate conductors. Form lightly doped source/drain regions, form spacers and source/drain regions in the well. Form a first inter- conductor dielectric layer on the cell. Define a self-aligned contact region in the cell above source/drain regions. Form a second conductor layer over the cell and patterning the second conductor layer to form a via in the self-aligned contact region. Form a second inter-conductor dielectric layer on the cell, a third conductor layer over the cell and patterning the third conductor layer to form a first resistor connected to the self-aligned contact region.
机译:这是在掺杂的半导体衬底中的阱上形成SRAM晶体管单元的方法。在阱中形成掩埋接触区的栅氧化层和分离栅层,并通过分离栅层和栅氧化层通向阱。形成中间导体层和硬质氧化硅掩模层并定义栅极导体。在阱中形成轻掺杂的源/漏区,形成隔离层和源/漏区。在电池上形成第一导体间电介质层。在源极/漏极区域上方的单元格中定义一个自对准接触区域。在单元上方形成第二导体层,并对第二导体层进行构图,以在自对准接触区域中形成通孔。在单元上形成第二导体间电介质层,在单元上形成第三导体层,并构图第三导体层以形成连接到自对准接触区的第一电阻器。

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