首页> 外国专利> COPPER COMPLEX WITH WHICH SELECTIVE VAPOR DEPOSITION OF COPPER THIN FILM CAN BE DONE, ITS METHOD FOR VAPOR PHASE DEPOSITION AND METHOD FOR SELECTIVE ETCHING OF THIN FILM

COPPER COMPLEX WITH WHICH SELECTIVE VAPOR DEPOSITION OF COPPER THIN FILM CAN BE DONE, ITS METHOD FOR VAPOR PHASE DEPOSITION AND METHOD FOR SELECTIVE ETCHING OF THIN FILM

机译:可以完成铜薄膜选择性气相沉积的铜络合物,其气相沉积方法和薄膜的选择性刻蚀方法

摘要

Volatile liquid or low melting solid organometallic copper complexes are provided which are capable of selectively depositing a copper film onto metallic or other electrically conducting portions of a substrate surface under CVD conditions. These organometallic copper complexes are represented by the structural formula: CHEM wherein R1 and R3 are each independently C1-C8 perfluoroalkyl, R2 is H, F or C1-C8 perfluoroalkyl, R4 is C1-C8 alkyl, phenyl, or Si(R5)3, and each R5 is independently C1-C8 alkyl or phenyl. A process for depositing copper films using these organometallic copper complexes is also provided.
机译:提供了挥发性液体或低熔点固体有机金属铜络合物,其能够在CVD条件下选择性地将铜膜沉积到基底表面的金属或其他导电部分上。这些有机金属铜络合物由结构式表示:<CHEM>其中R 1和R 3各自独立地为C 1 -C 8全氟烷基,R 2为H,F或C 1 -C 8全氟烷基,R 4。 R 5是C 1 -C 8烷基,苯基或Si(R 5)3,并且每个R 5独立地是C 1 -C 8烷基或苯基。还提供了使用这些有机金属铜络合物沉积铜膜的方法。

著录项

  • 公开/公告号JPH05202476A

    专利类型

  • 公开/公告日1993-08-10

    原文格式PDF

  • 申请/专利权人 AIR PROD AND CHEM INC;

    申请/专利号JP19920275200

  • 发明设计人 JIYON ANSONII TOOMASU NOOMAN;

    申请日1992-09-18

  • 分类号C23C16/18;C23C16/56;C23F1/12;

  • 国家 JP

  • 入库时间 2022-08-22 05:14:05

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