首页> 外国专利> PHOTOGRAPHING METHOD AND DEVICE FOR TRANSMISSION ELECTRON MICROSCOPE OR ELECTRONIC ENERGY LOSS ANALYSIS ELECTRON MICROSCOPE

PHOTOGRAPHING METHOD AND DEVICE FOR TRANSMISSION ELECTRON MICROSCOPE OR ELECTRONIC ENERGY LOSS ANALYSIS ELECTRON MICROSCOPE

机译:透射电子显微镜或电子能量损失分析电子显微镜的照相方法和装置

摘要

PURPOSE: To correct the distortion of an image after an optical photographing of a transmission electron microscope or an electronic energy loss analyzer. ;CONSTITUTION: A scanning signal applied to the scanning deflection coil 17 of an image pick-up tube 16 is rectified by a scanning rectifier 19 to make the sample image photographed by the image pick-up tube 16 and displayed in an image display device 20 into an image with no distortion. By rectifying the image pick-up tube scanning signal to make the display image of the known standard sample in an image with no distortion in the structure also to the distortion of an analyzing image by an asymmetric fragment magnetic field or by a magnetic field quadruple lens, or by rectifying to make the display image into the same image with a permeation electron microscope image by making the image as a standard, the aberration of an electron optical system is corrected by a photographing device part, and an image with no distortion can be displayed.;COPYRIGHT: (C)1995,JPO
机译:目的:校正透射电子显微镜或电子能量损失分析仪的光学照相后图像的失真。 ;构成:施加到摄像管16的扫描偏转线圈17上的扫描信号由扫描整流器19整流,以使由摄像管16拍摄的样本图像显示在图像显示装置20中。变成没有失真的图像。通过校正摄像管扫描信号以使结构中无畸变的图像中的已知标准样品的显示图像也变为非对称碎片磁场或磁场四倍透镜对分析图像的畸变或者,通过将其作为基准,通过使显示图像与透过型电子显微镜图像校正为同一图像,通过拍摄装置部对电子光学系统的像差进行校正,从而可以得到没有畸变的图像。展示;版权:(C)1995,日本特许厅

著录项

  • 公开/公告号JPH0721961A

    专利类型

  • 公开/公告日1995-01-24

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19930165718

  • 发明设计人 TAYA TOSHIMICHI;OHASHI TOSHIYUKI;

    申请日1993-07-05

  • 分类号H01J37/22;

  • 国家 JP

  • 入库时间 2022-08-22 04:24:43

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