首页> 外国专利> WAFER DRIER

WAFER DRIER

机译:威发

摘要

PURPOSE: To prevent sticking of particulates or occurrence of breakdown due to electrification of a semiconductor wafer during drying in a semiconductor wafer drier. ;CONSTITUTION: An electrification quantity measuring sensor 1 to measure an electrification quantity of a wafer and an alarm device 2 are arranged in a semiconductor wafer drier, and when the electrification quantity reaches a predetermined inspection value or a danger value, an alarm is issued, and an operator is made to inspect the existence of consumption of a static electricity eliminating needle or contact failure of a high voltage cable, and the occurrence of trouble by electrification is beforehand prevented.;COPYRIGHT: (C)1995,JPO
机译:用途:为了防止在半导体晶片干燥机中干燥过程中由于半导体晶片的带电而导致微粒粘附或击穿。 ;构成:在半导体晶片干燥器中配置有用于测量晶片的带电量的带电量测量传感器1和警报装置2,当带电量达到预定的检查值或危险值时,发出警报,并让操作员检查是否存在静电消除针的消耗或高压电缆的接触故障,并事先防止因电气化而发生故障。;版权所有:(C)1995,日本特许厅

著录项

  • 公开/公告号JPH07169587A

    专利类型

  • 公开/公告日1995-07-04

    原文格式PDF

  • 申请/专利权人 KAIJO CORP;

    申请/专利号JP19930341885

  • 发明设计人 SATO SHIGEHISA;NUMANO NORIFUMI;

    申请日1993-12-13

  • 分类号H05F3/04;F26B25/00;G01R29/24;

  • 国家 JP

  • 入库时间 2022-08-22 04:21:26

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号