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Method for introducing platinum atoms into a silicon wafer for the purpose of reducing the minority carrier lifetime

机译:为了减少少数载流子寿命而将铂原子引入硅晶片的方法

摘要

Platinum atoms are distributed uniformly in a silicon wafer 9 containing pn junctions by a platinum layer being applied to a clean silicon surface and the silicon wafer 9 being heated to about 500 degree C immediately afterwards in order to form platinum silicide 41. The silicon wafer 9 is then heated to about 900 degree C for a short time in order to cause the platinum atoms to diffuse into the silicon wafer 9, in which case, however, the temperature is too low, and the time too short, to bring about shifting of the pn junctions in the silicon wafer 9. IMAGE
机译:通过将铂层施加到干净的硅表面上,然后立即将硅晶片9加热到约500℃,使铂原子均匀地分布在包含pn结的硅晶片9中,以形成硅化铂41。硅晶片9然后在短时间内将其加热到约900℃,以使铂原子扩散到硅晶片9中,在这种情况下,温度太低,时间太短,以致于不能移动硅。硅晶圆9中的pn结。

著录项

  • 公开/公告号AT399419B

    专利类型

  • 公开/公告日1995-05-26

    原文格式PDF

  • 申请/专利权人 INTERNATIONAL RECTIFIER CORPORATION;

    申请/专利号AT19930000991

  • 发明设计人

    申请日1993-05-19

  • 分类号H01L21/225;

  • 国家 AT

  • 入库时间 2022-08-22 04:17:02

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