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Method and apparatus for analyzing nodal interference patterns vibrationally induced in semi-monocoque structure

机译:分析半硬壳结构中振动引起的节点干涉图样的方法和装置

摘要

Methods and apparatus for automatically analyzing anti-nodal patterns formed in the outer skin of a semi-monocoque structure when it is excited to vibrate at a resonant frequency at which out-of-plane displacement is optimized. The described principles of analysis may be utilized to analyze a recorded image of the anti-nodal patterns obtained by holographic interferometry, or to directly examine the anti-nodal pattern by scanning a test area of the surface with a beam of coherent radiation, e.g., a laser beam, and utilizing the Doppler effect, measuring, recording and displaying a contour map showing out-of-plane displacement of the surface for analysis. In the holographic record case, comparison of the fringe density of the anti-nodes against the density of any fringes which may occur along normally fringe-free lines of underlying structure reveals the type and location of any structural faults. In the laser Doppler system, faults are identified by comparing the surface displacement of the anti-nodes with any displacements occurring along lines of the underlying structure.
机译:当半单壳结构的外壳以最佳平面外位移的共振频率振动时,用于自动分析在半硬壳结构的外皮中形成的抗结图案的方法和装置。所描述的分析原理可用于分析通过全息干涉术获得的抗结图案的记录图像,或通过用相干辐射束(例如,光束)扫描表面的测试区域来直接检查抗结图案。激光束,并利用多普勒效应测量,记录和显示等高线图,以显示要分析的表面平面外位移。在全息记录的情况下,将波腹的条纹密度与可能沿着下层结构的正常无条纹线出现的任何条纹的密度进行比较,就可以发现任何结构性断层的类型和位置。在激光多普勒系统中,通过将波腹的表面位移与沿基础结构的线发生的位移进行比较来识别故障。

著录项

  • 公开/公告号US5408305A

    专利类型

  • 公开/公告日1995-04-18

    原文格式PDF

  • 申请/专利权人 HOLOGRAPHICS INC.;

    申请/专利号US19930108123

  • 发明设计人 JACQUELINE M. MEW;JOHN M. WEBSTER;

    申请日1993-08-17

  • 分类号G01L1/24;

  • 国家 US

  • 入库时间 2022-08-22 04:05:05

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