首页> 外国专利> Methods and apparatus for generating short length patterns that induce inter-symbol interference

Methods and apparatus for generating short length patterns that induce inter-symbol interference

机译:产生引起码间干扰的短码型的方法和装置

摘要

One embodiment relates to a method of generating worst case inter-symbol interference (ISI) inducing short patterns for simulating and/or testing a communication link. The method includes the generation of a binary clock sequence comprising bits of alternating values at the beginning of the pattern. In addition, an ISI inducing binary sequences and its complement are generated after the clock sequence. Another embodiment relates to a pattern generator for generating an worst case inter-symbol interference inducing short pattern for testing a communication link. Other embodiments, aspects, and features are also disclosed.
机译:一个实施例涉及一种产生最坏情况的符号间干扰(ISI)的方法,该方法引起用于仿真和/或测试通信链路的短模式。该方法包括生成二进制时钟序列,该二进制时钟序列在模式的开头包括交替值的比特。另外,在时钟序列之后产生ISI诱导二进制序列及其补码。另一个实施例涉及一种模式发生器,用于产生最坏情况的符号间干扰引起的短模式,以测试通信链路。还公开了其他实施例,方面和特征。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号