首页> 外国专利> METHOD FOR GROWING SILICON CARBIDE CRYSTAL AND SILICON CARBIDE SEMICONDUCTOR DEVICE

METHOD FOR GROWING SILICON CARBIDE CRYSTAL AND SILICON CARBIDE SEMICONDUCTOR DEVICE

机译:碳化硅晶体和碳化硅半导体器件的生长方法

摘要

PROBLEM TO BE SOLVED: To form a smooth carbon surface on a substrate surface by etching an α-SiC crystal substrate with a hydrogen-contg. gas, then epitaxially growing SiC with glass contg. silicon and carbon at a higher temp. ;SOLUTION: The α-SiC substrate is etched by the gas contg. hydrogen (for example, a gaseous mixture composed of hydrogen and hydrogen chloride) at the first temp. in a first stage. The gas contg. the silicon and carbon (e.g.; a gaseous mixture composed of gaseous silane and gaseous propane) is supplied onto this SiC substratie at the second temp. higher than the first temp. to epitaxially grow the SiC on the substrate in a second stage. The epitaxially grown SiC substrate is cooled to form the smooth carbon surface having good quality on the surface of the SiC substrate in a third stage. The substrate is preferably etched with the gas contg. the hydrogen at a third temp. lower than the first temp. to remove the spherical matter generated in the first stage between the first stage and the second stage.;COPYRIGHT: (C)1997,JPO
机译:要解决的问题:通过用氢腐蚀α-SiC晶体衬底在衬底表面上形成光滑的碳表面。气体,然后用玻璃继续外延生长SiC。高温下的硅和碳。 ;解决方案:通过气体腐蚀来腐蚀α-SiC衬底。在第一温度下氢气(例如,由氢气和氯化氢组成的气体混合物)。在第一阶段。气续然后在第二温度下将硅和碳(例如,由气态硅烷和气态丙烷组成的气态混合物)供应到该SiC基质上。比第一温度高。在第二阶段中在衬底上外延生长SiC。在第三阶段中,冷却外延生长的SiC衬底以在SiC衬底的表面上形成具有良好品质的光滑碳表面。衬底优选地用气体浓度蚀刻。在第三温度下氢。低于第一温度去除在第一阶段和第二阶段之间的第一阶段中产生的球形物质。;版权:(C)1997,JPO

著录项

  • 公开/公告号JPH0952796A

    专利类型

  • 公开/公告日1997-02-25

    原文格式PDF

  • 申请/专利权人 FUJI ELECTRIC CO LTD;

    申请/专利号JP19950210321

  • 发明设计人 URUSHIYA TANIO;

    申请日1995-08-18

  • 分类号C30B29/36;C30B33/12;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-22 03:33:36

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号