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Resistor formation formation manner and metal organic matter resistor film null to insulating substrate

机译:电阻器的形成方式以及金属有机物电阻器膜相对于绝缘基板为零的情况

摘要

PURPOSE:To form a resistor layer having a uniform thickness on an insulating base surface by attaching with pressure a metallo-organic resistor layer of a metallo-organic resistor film on the insulating base surface. CONSTITUTION:A metallo-organic resistor film F cut into a proper size is arranged such that its metallo-organic resistor layer 22' contacts with the surface of an insulating base 2. The metallo-organic resistor film F is pressed on the surface of the insulating base 2 by a heater head 24 heated to about 120 deg.C. At this time, the metallo-organic resistor layer 22' of the metallo-organic resistor film F is softened slightly and attached with pressure on the surface of the insulating base 2. When the insulating base 2 having the metallo-organic resistor film F attached thereto is baked in an infrared kiln with a peak temperature 800 deg.C for about 10 minutes, a film body 21 of the metallo-organic resistor film F burns off in the kiln so that a resistor layer 3L will be formed on the surface of the insulating base 2.
机译:目的:通过在绝缘基体表面上加压附着金属有机电阻器膜的金属有机电阻器层,在绝缘基体表面上形成厚度均匀的电阻器层。构成:切成适当尺寸的金属有机电阻器膜F使其金属有机电阻器层22'与绝缘基底2的表面接触。金属有机电阻器膜F压在绝缘体2的表面上。通过加热到约120℃的加热头24使绝缘基底2绝缘。此时,金属有机电阻器膜F的金属有机电阻器层22'略微软化,并在压力下附着在绝缘基体2的表面上。当绝缘基体2附着有金属有机电阻器膜F时将其在峰值温度为800℃的红外线窑炉中烘烤约10分钟,金属有机电阻器膜F的膜体21在窑炉中烧掉,从而在电阻器表面上形成电阻器层3L。绝缘底座2。

著录项

  • 公开/公告号JP2606416B2

    专利类型

  • 公开/公告日1997-05-07

    原文格式PDF

  • 申请/专利权人 富士ゼロックス株式会社;

    申请/专利号JP19900187731

  • 发明设计人 馬場 和夫;白附 好之;

    申请日1990-07-16

  • 分类号B41J2/335;H01C7/00;H01C17/06;

  • 国家 JP

  • 入库时间 2022-08-22 03:28:44

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