Optically stimulated luminescence (OSL) dosimetry in irradiated alumina substrates from mobile phone resistors

摘要

In this study the dosimetric properties of alumina (Al2O3) substrates found in resistors retrieved from mobile phones were investigated. Measurements of the decline of optically stimulated luminescence (OSL) generated following exposure of these substrates to ionising radiation showed that 16% of the signal could still be detected after 2 years (735 days). Further, the magnitude of the regenerative dose (calibration dose; D i) had no impact on the accuracy of dose estimates. Therefore, it is recommended that the D i be set as low as is practicable, so as to accelerate data retrieval. The critical dose, D CL, and dose limit of detection, D DL, taking into account the uncertainty in the dose–response relation as well as the uncertainty in the background signal, was estimated to be 7 and 13 mGy, respectively, 1 h after exposure. It is concluded that given the significant long-term component of fading, an absorbed dose of 0.5 Gy might still be detectable up to 6 years after the exposure. Thus, OSL from alumina substrates can be used for dosimetry for time periods far in excess of those previously thought.