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Semiconductor apparatus having wiring groove and contact hole formed in self-alignment manner and method of fabricating the same

机译:具有以自对准方式形成的布线槽和接触孔的半导体装置及其制造方法

摘要

A semiconductor apparatus and a process for fabricating the same according to the invention permit reduction in width of a wiring pattern of the semiconductor apparatus and in distance between wiring elements. A stopper film (13a) and an insulating film (13b) are provided on a substrate (11). The etching rate of RIE for the insulating film (13b) is greater than that for the stopper film (13a). The stopper film (14a) and insulating film (14b) are formed on the insulating film (13b). A pattern of the contact hole (32) is formed in the stopper film (14a). A wiring pattern is formed on the resist film (35). The insulating films (13b,14b) are etched by RIE with the resist film (35) and stopper film (14a) used as masks. Thus, a groove (31) for formation of wiring and a contact hole (32) for formation of a contact plug are simultaneously formed in a self-alignment manner.
机译:根据本发明的半导体装置及其制造方法允许减小半导体装置的布线图案的宽度以及布线元件之间的距离。在基板(11)上设置有阻挡膜(13a)和绝缘膜(13b)。绝缘膜(13b)的RIE的蚀刻速率大于阻挡膜(13a)的RIE的蚀刻速率。在绝缘膜(13b)上形成有停止膜(14a)和绝缘膜(14b)。接触孔(32)的图案形成在阻挡膜(14a)中。在抗蚀剂膜(35)上形成配线图案。利用抗蚀剂膜(35)和阻挡膜(14a)作为掩模,通过RIE对绝缘膜(13b,14b)进行蚀刻。因此,以自对准方式同时形成用于形成配线的凹槽(31)和用于形成接触塞的接触孔(32)。

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