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DIFFRACTION-MEASURING METHOD FOR DETECTION OF CRYSTAL-AXES ORIENTATION IN BIG SINGLE-CRYSTAL OF KNOWN STRUCTURE
DIFFRACTION-MEASURING METHOD FOR DETECTION OF CRYSTAL-AXES ORIENTATION IN BIG SINGLE-CRYSTAL OF KNOWN STRUCTURE
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机译:大单晶已知结构中晶轴取向的衍射测量方法
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摘要
FIELD: optical instruments. SUBSTANCE: method involves exposition of crystal surface to monochromatic X-rays. Crystal is rotated about axis of diffraction meter and in orientation plane in order to detect maximal reflection angles ω1 and ω2,. In addition in this position angles Φ1 and Φ2 of crystal position in rotation plane which is perpendicular to equatorial plane of goniometer. Method involves using of specific coordinate network for setting angles Φ1 and Φ2, detection of normal inclination to reflection plane with respect to orientation plane, and calculation of normal entrance to gnomonic stereographic projection by angle δ = (ω2-ω1)/2. Calculated projections of normal are used for calculation of total gnomonic stereographic projection of investigated crystal. This results in possibility to detect orientation of all cutting edges of diamond single-crystal tool with respect to its base planes. EFFECT: elimination of additional logging. 1 dwg, 2 tbl
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