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Heterojunction field effect transistor with non-alloy ohmic contact electrodes

机译:具有非合金欧姆接触电极的异质结场效应晶体管

摘要

An InAlAs/InGaAs type heterojunction FET is provided which can reduce the source and drain contact resistance through the InAlAs layer without lowering the sheet carrier concentration so as to form an ohmic contact without alloying. A laminated structure of an undoped InAlAs buffer layer, an undoped InGaAs channel layer which accumulates two- dimensional electron gas, InAlAs electron supply layers containing an n- type layer, an undoped InAlAs Schottky layer, a first cap layer of n-type InAlAs, a second cap layer, and a third cap layer of n-type InGaAs are sequentially formed on a semi-insulating InP substrate. When undoped InGaAs or n-type IN(AlGa)As is employed as the second cap layer, the potential barrier at the interfaces between the cap layers are reduced so that the contact resistivity between the cap layer and the channel layer can be reduced to as low as 10.sup.-7 &OHgr;cm.sup.2.
机译:提供了InAlAs / InGaAs型异质结FET,其可以降低通过InAlAs层的源极和漏极接触电阻,而不降低片载流子浓度,从而形成欧姆接触而不合金化。未掺杂的InAlAs缓冲层,积累二维电子气的未掺杂的InGaAs沟道层,包含n型层的InAlAs电子供应层,未掺杂的InAlAs肖特基层,n型InAlAs的第一盖层的叠层结构,在半绝缘的InP衬底上顺序地形成n型InGaAs的第二覆盖层和第三覆盖层。当将未掺杂的InGaAs或n型IN(AlGa)As用作第二盖层时,在盖层之间的界面处的势垒减小,从而可以将盖层与沟道层之间的接触电阻率减小至0。低至10.sup.-7&OHgr; cm.sup.2。

著录项

  • 公开/公告号US5621228A

    专利类型

  • 公开/公告日1997-04-15

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号US19950515530

  • 发明设计人 YUJI ANDO;

    申请日1995-08-15

  • 分类号H01L31/0328;H01L31/0336;

  • 国家 US

  • 入库时间 2022-08-22 03:10:17

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