首页> 外国专利> ASTIGMATIC CORRECTION METHOD AND ASTIGMATIC CORRECTION DEVICE

ASTIGMATIC CORRECTION METHOD AND ASTIGMATIC CORRECTION DEVICE

机译:散光矫正方法和散光矫正装置

摘要

PROBLEM TO BE SOLVED: To provide a charged particle optical lens barrel used in SEM, and to easily correct astigmatism with high accuracy. ;SOLUTION: A charged particle optical lens barrel has stigmata for correcting astigmatism. An astigmatic correction method of the charged particle optical lens barrel includes a first step S1 of focusing an objective lens into a secondary particle signal image obtained by extracting a secondary particle signal obtained by two-dimensionally scanning a sample with an electron beam, and also includes a second step S2 of correcting astigmatism by adjusting the stigmata to reduce the astigmatism of the electron beam with respect to the secondary particle signal image obtained in an adjusted focusing position.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:提供一种用于SEM的带电粒子光学镜筒,并以高精度轻松校正像散。 ;解决方案:带电粒子光学镜筒具有用于矫正散光的柱头。带电粒子光学镜筒的像散校正方法包括将物镜聚焦为通过提取通过用电子束二维扫描样本而获得的二次粒子信号而获得的二次粒子信号图像的第一步S1,并且还包括第二步骤S2,通过调整柱头以减小电子束相对于在调整后的聚焦位置获得的二次粒子信号图像的像散,来校正像散。;版权:(C)1998,JPO

著录项

  • 公开/公告号JPH10247466A

    专利类型

  • 公开/公告日1998-09-14

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP19970048962

  • 发明设计人 ONOGUCHI KAZUNORI;

    申请日1997-03-04

  • 分类号H01J37/153;H01J37/21;

  • 国家 JP

  • 入库时间 2022-08-22 03:08:38

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号