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SINGLE WAFER CLEANING SYSTEM

机译:单晶圆清洗系统

摘要

PROBLEM TO BE SOLVED: To provide a single wafer cleaning system in which a vacuum chuck is provided on a cleaning bath on which the back face of a wafer whose mirror face to be cleaned faces downward is vacuumed and fixed, a cleaning solution supply pipe is attached to the cleaning bath, and a cleaning solution is supplied and agitated, thereby suppressing occurrence of particles and performing uniform cleaning. ;SOLUTION: A vacuum chuck 9 is arranged in the upper part of a central axis H passing the center O of a cylindrical inner cleaning vessel 2 whose bottom 2a is gently inclined toward the center. The back face 8b of a semiconductor wafer 8 whose mirror face is directed downward is evacuated and fixed on the end 9a of the vacuum chuck 9. A cleaning solution supply pipe 4 having nozzles 4a and 4b is attached so that the nozzles 4a and 4b are symmetrical with respect to the right and left by using the center O of the circular bottom 2a of the inner cleaning vessel 2 as a center. A cleaning solution W is supplied into the inner cleaning vessel 2 and is agitated. The mirror face of the semiconductor wafer 8 is cleaned with the agitated cleaning solution W.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:为了提供一种单晶片清洗系统,其中在清洗槽上提供真空吸盘,在该清洗槽上将要清洗的镜面朝下的晶片背面抽真空并固定,清洗液供应管附着在清洗槽上的清洗液被供给和搅拌,从而抑制了颗粒的产生并进行均匀的清洗。解决方案:真空吸盘9布置在中心轴线H的上部,该中心轴线H穿过圆柱形内部清洁容器2的中心O,该内部清洁容器的底部2a向该中心缓慢倾斜。将镜面朝下的半导体晶片8的背面8b抽真空并固定在真空吸盘9的端部9a上。附接具有喷嘴4a和4b的清洁溶液供应管4,使得喷嘴4a和4b为真空。以内部清洁容器2的圆形底部2a的中心O为中心相对于左右对称。清洁溶液W被供应到内部清洁容器2中并且被搅拌。用搅拌的清洗液W清洗半导体晶片8的镜面。COPYRIGHT:(C)1998,JPO

著录项

  • 公开/公告号JPH104076A

    专利类型

  • 公开/公告日1998-01-06

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19960175965

  • 发明设计人 ISHIYAMA HIROSHI;AIBA TAKESHI;

    申请日1996-06-15

  • 分类号H01L21/304;H01L21/68;

  • 国家 JP

  • 入库时间 2022-08-22 03:01:46

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