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BAKING OVEN FOR THE HIGH-TEMPERATURE TREATMENT OF MATERIALS WITH A LOW DIELECTRIC LOSS FACTOR

机译:低介电损耗因子材料的高温烘烤炉

摘要

In a baking oven (10) for the high-temperature treatment of materials with a relatively low dielectric loss factor (tan δ) by heating the material by absorption of microwave energy in a resonant chamber (16), the material to be treated (11) is placed in a partial area of the resonant chamber in which a uniform energy intensity of the microwave field is established by irradiating microwave energy over a narrow band within a tolerance range, such that in each volume element of the treatment chamber the square (E2) of the electric field intensity of the microwave field, at least in its time average, has the same value within a narrow tolerance range. The ratio V/μ3 between the resonator volume V and the wavelength μ to the power of 3 has a value around 106. A slot antenna arrangement (14) with a marked lobe characteristic is provided to feed the primary microwave radiation generated by the microwave source (13) into the resonant chamber (16). The primary radiation emitted by the antenna arrangement almost completely lightens a microwave diffuser (19). The material to be treated is placed in a partial area of the resonant cavity in which it is exclusively exposed to the secondary microwave radiation from the diffuser (19).
机译:在用于通过在谐振腔室(16)中吸收微波能量加热材料而对介电损耗因子(tanδ)相对较低的材料进行高温处理的烘烤炉(10)中,待处理的材料(11 )放置在谐振腔的部分区域中,通过在公差范围内的窄带上辐射微波能量来建立微波场的均匀能量强度,使得在处理腔的每个体积元素中,正方形(E2 )至少在其时间平均范围内)的电场强度在狭窄的公差范围内具有相同的值。谐振器体积V和波长μ与3的幂之间的比率V /μ3约为106。提供具有明显波瓣特性的缝隙天线装置(14)来馈送微波源产生的初级微波辐射(13)进入谐振腔(16)。天线装置发射的主要辐射几乎完全照亮了微波扩散器(19)。将要处理的材料放置在谐振腔的部分区域中,在该区域中,该材料专门暴露于来自扩散器(19)的二次微波辐射。

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