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Method of reducing bird's beak of field oxide using reoxidized nitrided pad oxide layer

机译:使用再氧化的氮化垫氧化物层减少场氧化物的鸟喙的方法

摘要

A new method of local oxidation using an oxynitrided pad oxide layer to suppress the growth of a bird's beak is described. An oxide layer is provided over the surface of a semiconductor substrate. The oxide layer is annealed in a nitrogen atmosphere whereby the oxide layer is nitrided. The nitrided oxide layer is then reoxidized. A silicon nitride layer is deposited overlying the oxide layer. Portions of the silicon nitride and oxide layers not covered by a mask pattern are etched through to provide an opening exposing the portion of the semiconductor substrate that will form the field oxidation. The silicon substrate within the opening is oxidized wherein the semiconductor substrate is transformed to silicon dioxide wherein the nitrided oxide layer suppresses the formation of the bird's beak whereby the field oxidation is formed with a small bird's beak. The remaining oxide and silicon nitride layers are removed completing the field oxidation of the integrated circuit.
机译:描述了一种新的局部氧化方法,该方法使用氮氧化垫氧化物层抑制鸟嘴的生长。在半导体衬底的表面上方提供氧化物层。在氮气氛中使氧化物层退火,从而使氧化物层氮化。然后将氮化的氧化物层再氧化。氮化硅层沉积在氧化物层上。蚀刻掉未被掩模图案覆盖的氮化硅和氧化物层的部分以提供开口,该开口暴露出将形成场氧化的半导体衬底的部分。开口内的硅衬底被氧化,其中半导体衬底被转变成二氧化硅,其中氮化的氧化物层抑制了鸟喙的形成,从而利用小鸟嘴形成了场氧化。去除剩余的氧化物和氮化硅层,从而完成集成电路的场氧化。

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