首页> 外国专利> DEVICE FOR DETECTION OF SUBSTRATE IN SUBSTRATE CONTAINER, SUBSTRATE CARRYING-IN/CARRYING-OUT DEVICE HAVING THE DETECTION DEVICE, AND SUBSTRATE TREATMENT DEVICE HAVING THE CARRYING-IN/CARRYING-OUT DEVICE

DEVICE FOR DETECTION OF SUBSTRATE IN SUBSTRATE CONTAINER, SUBSTRATE CARRYING-IN/CARRYING-OUT DEVICE HAVING THE DETECTION DEVICE, AND SUBSTRATE TREATMENT DEVICE HAVING THE CARRYING-IN/CARRYING-OUT DEVICE

机译:用于基板容器中的基板的检测装置,具有该检测装置的基板的进/出装置,以及具有该基板的进/出装置的基板处理装置

摘要

PROBLEM TO BE SOLVED: To detect the presence of substrates in the container even if obstacles exist around a substrate container, by a method wherein the presence of the substrates in the substrate container is photographed and the photographed image information is analyzed to detect the presence of the substrates in the substrate container. ;SOLUTION: A substrate detection device 2 which detects the presence of substrates W in a substrate container 1 is composed of a CCD camera 3, an image memory 4, an image analysis unit 5, etc. The presence in the substrate container 1 is photographed by the CCD camera 3 which is located at a predetermined photographing position and stored in the image memory 4. The image analysis unit 5 consisting of a CPU analyzes the concentration data, etc., of an image stored in the image memory 4 to detect the presence of the substrates W which is stored in a detection result memory 6. As the presence can be detected by photographing the presence of the substrates W in the substrate container 1 from a distant position, it is not necessary to move a photosensor, etc., near the substrates W, so that the substrates W can be protected from contamination during the detection.;COPYRIGHT: (C)1998,JPO
机译:要解决的问题:即使在基板容器周围存在障碍物,也要检测容器中基板的存在,可以采用以下方法:对基板容器中基板的存在进行拍照,并对拍摄的图像信息进行分析,以检测基板中是否存在基板。基板容器中的基板。 ;解决方案:用于检测基板容器1中基板W的存在的基板检测装置2由CCD摄像机3,图像存储器4,图像分析单元5等组成。对基板容器1中的存在进行拍照。通过位于预定拍摄位置并存储在图像存储器4中的CCD照相机3,由CPU组成的图像分析单元5分析存储在图像存储器4中的图像的浓度数据等,以检测图像的浓度。存储在检测结果存储器6中的基板W的存在。由于可以通过从远处拍摄基板容器1中的基板W的存在来检测其存在,因此不需要移动光电传感器等。 ,靠近基片W,因此可以保护基片W在检测期间不受污染。;版权所有:(C)1998,日本特许厅

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