首页> 外国专利> Methods and layers for calibrating a thickness measuring device, a tape, a device for measuring or monitoring the thickness of the foil, etc.

Methods and layers for calibrating a thickness measuring device, a tape, a device for measuring or monitoring the thickness of the foil, etc.

机译:用于校准厚度测量装置,胶带,用于测量或监测箔厚度的装置的方法和层,等等。

摘要

A process for calibrating a thickness tester with preferably two travel measuring sensors (2, 3) operating with or without contact is proposed in which thickness testers operating on various measuring principles can be easily calibrated, where the measurement must be performed, by means of a reference object (7).
机译:提出了一种用于校准厚度测试仪的方法,该方法优选地具有两个接触或不接触地运行的行程测量传感器(2、3),其中可以容易地校准以各种测量原理运行的厚度测试仪,其中必须通过以下方式进行测量:参考对象(7)。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号