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Method and apparatus for measuring permittivities of ferroelectric liquid crystals by preparing a homeotropic cell and a planar homogeneous cell

机译:通过制备各向同性盒和平面均质盒来测量铁电液晶介电常数的方法和设备

摘要

There is provided a method that permittivities ε₁, ε₂, and ε₃ of principal axes of ferroelectric liquid crystals (7) are correctly measured. There are prepared a homeotropic cell in which a smectic layer composed of ferroelectric liquid crystals (7) to be subjected to measurement are aligned in parallel with substrates (1a, 1b) and a planar homogeneous cell having a chevron layer structure in which the smectic layer composed of the ferroelectric liquid crystals (7) is bent in the middle portions thereof with respect to the substrates (1a, 1b). A high-frequency probe voltage having a level at which the orientation of the liquid crystal molecules does not change is applied to the homeotropic cell to measure a permittivity εh. The probe voltage is applied to the planar homogeneous cell to measure a permittivity εp. With a DC or low-frequency bias voltage applied to the planar homogeneous cell to align the spontaneous polarization of the liquid crystal molecules in a specified direction in the smectic layer, the probe voltage is applied to the cell to measure a permittivity εPDC. Based on the three permittivities εh, εp, and εpDC, the principal axis permittivities ε₁, ε₂, and ε₃ are obtained according to a specified relational expression.
机译:提供了一种正确测量铁电液晶(7)主轴的介电常数ε1,ε2和ε1的方法。制备了其中由待测量的铁电液晶(7)组成的近晶层与基板(1a,1b)平行排列的垂直电池和具有人字形层结构的平面均质电池,其中近晶层结构由铁电液晶(7)构成的基板在其中部相对于基板(1a,1b)弯曲。将具有液晶分子的取向不改变的电平的高频探针电压施加到各向同性盒以测量介电常数εh。探针电压被施加到平面均质电池以测量介电常数εp。通过将DC或低频偏置电压施加到平面均质单元上,以使液晶分子的近来层在近晶层中的指定方向上对齐,将探针电压施加到该单元上以测量介电常数εPDC。基于三个介电常数εh,εp和εpDC,根据指定的关系表达式获得主轴介电常数ε1,ε2和ε1。

著录项

  • 公开/公告号EP0625711B1

    专利类型

  • 公开/公告日1999-03-10

    原文格式PDF

  • 申请/专利权人 SHARP KK;

    申请/专利号EP19940303562

  • 发明设计人 ITOH NOBUYUKI;

    申请日1994-05-18

  • 分类号G01R31/28;G02F1/13;

  • 国家 EP

  • 入库时间 2022-08-22 02:20:20

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