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Method and apparatus for measuring permittivities of ferroelectric liquid crystals by preparing a homeotropic cell and a planar homogeneous cell
Method and apparatus for measuring permittivities of ferroelectric liquid crystals by preparing a homeotropic cell and a planar homogeneous cell
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机译:通过制备各向同性盒和平面均质盒来测量铁电液晶介电常数的方法和设备
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摘要
There is provided a method that permittivities ε₁, ε₂, and ε₃ of principal axes of ferroelectric liquid crystals (7) are correctly measured. There are prepared a homeotropic cell in which a smectic layer composed of ferroelectric liquid crystals (7) to be subjected to measurement are aligned in parallel with substrates (1a, 1b) and a planar homogeneous cell having a chevron layer structure in which the smectic layer composed of the ferroelectric liquid crystals (7) is bent in the middle portions thereof with respect to the substrates (1a, 1b). A high-frequency probe voltage having a level at which the orientation of the liquid crystal molecules does not change is applied to the homeotropic cell to measure a permittivity εh. The probe voltage is applied to the planar homogeneous cell to measure a permittivity εp. With a DC or low-frequency bias voltage applied to the planar homogeneous cell to align the spontaneous polarization of the liquid crystal molecules in a specified direction in the smectic layer, the probe voltage is applied to the cell to measure a permittivity εPDC. Based on the three permittivities εh, εp, and εpDC, the principal axis permittivities ε₁, ε₂, and ε₃ are obtained according to a specified relational expression.
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