首页> 外国专利> METHOD OF MANUFACTURING SOI WAFER HAVING A MULTI-LAYER STRUCTURE BY SILICON WAFER JUNCTION AT LOW TEMPERATURE AND SOI WAFER MANUFACTURED BY THIS METHOD

METHOD OF MANUFACTURING SOI WAFER HAVING A MULTI-LAYER STRUCTURE BY SILICON WAFER JUNCTION AT LOW TEMPERATURE AND SOI WAFER MANUFACTURED BY THIS METHOD

机译:通过低温硅晶片结制造具有多层结构的SOI晶片的方法以及通过该方法制造的SOI晶片

摘要

The present invention is the first step of outer diameter processing and cutting the silicon single crystal rod, mirror-polished only one side of the cut silicon wafer, the second step of forming an insulating oxide film only on one of the two wafers, vacuum at room temperature or special A third step of bonding silicon under a gas atmosphere, a fourth step of heat-treating and mirror-polishing two bonded silicon wafers, and polishing, etching, and mirror-polishing the opposite surface of the bonded surface on the wafer on which the insulated oxide film is formed. Provided are a method of manufacturing an SOI wafer, which is performed by steps including a fifth process, and an SOI wafer manufactured by the method.
机译:本发明是外径处理和切割单晶硅棒的第一步,仅对切割的硅晶片的一侧进行镜面抛光,第二步仅在两个晶片之一上形成绝缘氧化膜,在真空下进行。室温或特殊条件下在气体气氛下进行硅键合的第三步,对两个键合硅片进行热处理和镜面抛光,然后对晶片上键合表面的另一面进行抛光,蚀刻和镜面抛光的第四步在其上形成绝缘氧化膜。提供一种通过包括第五工艺的步骤执行的SOI晶片的制造方法以及通过该方法制造的SOI晶片。

著录项

  • 公开/公告号KR0180622B1

    专利类型

  • 公开/公告日1999-04-15

    原文格式PDF

  • 申请/专利权人 SILTRON INC.;

    申请/专利号KR19950042534

  • 发明设计人 조기현;한종원;

    申请日1995-11-21

  • 分类号H01L21/31;

  • 国家 KR

  • 入库时间 2022-08-22 02:16:14

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