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NONVOLATILE SEMICONDUCTOR DEVICE HAVING A METAL-INSULATOR-SEMICONDUCTOR GATE STRUCTURE

机译:具有金属-绝缘体-半导电门结构的非易失性半导体器件

摘要

SUMMARY OF THE INVENTION An object of the present invention is to realize a low voltage, low power consumption, and an increase in the number of operations of a write erase operation in a semiconductor nonvolatile memory device, and to improve the performance of a nonvolatile semiconductor memory device such as a flash memory. It is done.;In a MIS type semiconductor nonvolatile memory device, among the gate insulating films formed of two insulating films of the first insulating film and the second insulating film, the second insulating film is formed of a high dielectric constant film and the composition of the high dielectric constant film is continuously or non-volatile. It is continuously changed or silicon fine particles are formed between the first insulating film and the second insulating film.
机译:发明内容本发明的目的是在半导体非易失性存储器件中实现低电压,低功耗并且增加写擦除操作的操作数量,并且提高非易失性半导体的性能。存储设备,例如闪存。在MIS型半导体非易失性存储装置中,在由第一绝缘膜和第二绝缘膜的两个绝缘膜形成的栅极绝缘膜中,第二绝缘膜由高介电常数膜和其组成形成。高介电常数膜的一部分是连续的或非易失性的。它连续变化或在第一绝缘膜和第二绝缘膜之间形成硅微粒。

著录项

  • 公开/公告号KR100190158B1

    专利类型

  • 公开/公告日1999-06-01

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号KR19950013797

  • 发明设计人 엔도 노부히로;

    申请日1995-05-30

  • 分类号H01L29/788;

  • 国家 KR

  • 入库时间 2022-08-22 02:16:04

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